Contracts Finder · Tender

High-Voltage Semiconductor Probing System and Parameter Analyser System

A public procurement published by The University of Warwick via Contracts Finder.

Contracts FinderTender
Award value
Tender value
0
Suppliers
0
Awards
2
Notices
Tender
Stage

Overview

The University of Warwick has a requirement to update its high voltage characterisation facility comprising a parameter analyser and probe station (prober). The combined facility will be capable of making current-voltage (I-V) and capacitance-voltage (C-V) measurements on power semiconductor devices made in house, both on-wafer (or on-chip) through the use of the prober, and packaged. This tender is split into two separate lots; o Lot 1 - High-Voltage Semiconductor Probing System (Prober) o Lot 2 - High-Voltage Parameter Analyser System In order to express interest in this opportunity please go to the University of Warwick In-Tend supplier por…

Key details

Source
Contracts Finder
Lifecycle stage
Tender
Status
active
CPV classification
38000000 — Laboratory, optical and precision equipments (excl. glasses)
Currency
GBP
Total award value
Tender value
First published
24 Jul 2017
Last updated
24 Jul 2017
View the original notice

Notice timeline

Every published notice in this procurement's lifecycle.

  1. Tender noticeHigh-Voltage Semiconductor Probing System and Parameter Analyser System
  2. Tender amendmentHigh-Voltage Semiconductor Probing System and Parameter Analyser System

Frameworks & programmes

More from The University of Warwick

FAQs about this procurement

Who is the buyer for "High-Voltage Semiconductor Probing System and Parameter Analyser System"?

High-Voltage Semiconductor Probing System and Parameter Analyser System is a UK public-sector procurement published by The University of Warwick via Contracts Finder.

Has "High-Voltage Semiconductor Probing System and Parameter Analyser System" been awarded?

No award has been recorded yet. The current lifecycle stage is "Tender".

When was "High-Voltage Semiconductor Probing System and Parameter Analyser System" published?

It was first published on 24 Jul 2017 and last updated on 24 Jul 2017, across 2 notices.

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