Tender amendment · Contracts Finder
High-Voltage Semiconductor Probing System and Parameter Analyser System
Part of High-Voltage Semiconductor Probing System and Parameter Analyser System.
The University of Warwick has a requirement to update its high voltage characterisation facility comprising a parameter analyser and probe station (prober). The combined facility will be capable of making current-voltage (I-V) and capacitance-voltage (C-V) measurements on power semiconductor devices made in house, both on-wafer (or on-chip) through the use of the prober, and packaged. This tender is split into two separate lots; o Lot 1 - High-Voltage Semiconductor Probing System (Prober) o Lot 2 - High-Voltage Parameter Analyser System In order…
- Published
- 24 Jul 2017
- Status
- active
- CPV
- 38000000 — Laboratory, optical and precision equipments (excl. glasses)
- Tender period
- — – 24 Aug 2017
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FAQs about this notice
What type of notice is this?
This is a tender amendment published via Contracts Finder on 24 Jul 2017.
Which procurement does this notice belong to?
It is part of "High-Voltage Semiconductor Probing System and Parameter Analyser System", published by The University of Warwick.
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