3629/JN - Spectroscopic Ellipsometer with Mapping Capability

The University of Sheffield's Faculty of Science with funding from EPSRC, are looking to procure a spectroscopic ellipsometer with mapping capability. The instrument will be used for the characterisation of a wide range of materials including metals, dielectrics, molecular materials, polymers and biological materials. It will be used to characterise the optical properties of surfaces, thin films, multicomponent structures, and patterned and microstructured materials. These materials are of interest because of their optical, electronic, biological and other properties; characterisation by spectroscopic ellipsometry will yield information on their optical constants, micro- and nano-morphol…