3022/JN - Scanning Electron Microscope (SEM) with Microanalysis Capability

The University of Sheffield's Department of Materials Science and Engineering with funding from the EPSRC are looking to procure a scanning electron microscope (SEM). The required SEM will provide an underpinning multi-user environment with which to perform high throughput electron beam imaging to nm resolution with an ability for simultaneous X-ray compositional analysis (EDS) of a broad range of materials. These materials include, but not restricted to, metals, ceramics, polymers/biomaterials and glasses. The instrument must include the ability to image non-conducting or beam sensitive materials though variable accelerating voltage and pressure modes. An overarching requirement is the ins…