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Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester
Part of Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester.
The University of Warwick has a requirement to purchase a Dynamic Reliability & Robustness Power Characterisation Tester designed for testing wide bandgap (SiC and GaN) power semiconductor device. In order to express interest in this opportunity please go to the University of Warwick In-Tend supplier portal (https://in-tendhost.co.uk/universityofwarwick). The University of Warwick is not a contracting authority for the purposes of the Public Contracts Regulations 2015 (as amended) or the Procurement Act 2023 and associated Procurement Regulations 2024 (and as may be amended from time to time…
- Published
- 8 Dec 2025
- Status
- active
- CPV
- —
- Tender period
- — – 7 Jan 2026
Other notices in this procurement
This is the only notice on record.
FAQs about this notice
What type of notice is this?
This is a tender notice published via Find a Tender on 8 Dec 2025.
Which procurement does this notice belong to?
It is part of "Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester", published by UNIVERSITY OF WARWICK.
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