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NMS - Variable Pressure Field Emission Gun Scanning Electron Microscope with Analytical Detectors & Specimen Coater

Part of NMS - Variable Pressure Field Emission Gun Scanning Electron Microscope with Analytical Detectors & Specimen Coater.

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This tender seeks to procure a Variable Pressure Field-Emission Gun Scanning Electron Microscope (VP FEG-SEM) and a range of analytical detectors (CL, EDX, WDS, EBDSD) and specimen coater (C/Pt) to enable high-resolution imaging and analysis which can be used in concert at the National Museums Collection Centre in Edinburgh to study a wide range of collections.

Published
5 Jan 2022
Status
active
CPV
38511100 — Scanning electron microscopes
Tender period
— – 11 Feb 2022
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FAQs about this notice

What type of notice is this?

This is a tender notice published via Find a Tender on 5 Jan 2022.

Which procurement does this notice belong to?

It is part of "NMS - Variable Pressure Field Emission Gun Scanning Electron Microscope with Analytical Detectors & Specimen Coater", published by National Museums Scotland.

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