This contract is a one-off supply only and has now been awarded. Dual Beam Focused Ion Beam –Scanning Electron Microscope instrument. The instrument will be used for the investigation of a wide range of materials, including polymers, metals, ceramics, glasses, composites, semiconductors, nanomaterials, nanostructures and coatings. For the purposes of this procurement our requirements have been divided into 3 lots as follows:- Lot 1 – Focused Ion Beam Scanning Electron Microscope (FIB SEM) system. Lot 2 – Cooling system for FIB SEM. Lot 3 – Energy Dispersive spectroscopy system for FIB S…
- Procurement
- Ion Beam Facility
- Published
- 18 Nov 2016
- Status
- complete
- CPV
- 38510000 — Microscopes
- Tender period
- — – 9 Jun 2015
Awards
Other notices in this procurement
This is the only notice on record.
FAQs about this notice
What type of notice is this?
This is a award notice published via Contracts Finder on 18 Nov 2016.
Which procurement does this notice belong to?
It is part of "Ion Beam Facility", published by THE UNIVERSITY OF SHEFFIELD.
Has this notice resulted in an award?
3 awards are recorded on this notice, including to FEI UK Ltd.
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