Tender notice · Contracts Finder
I06 Aberration Corrected PEEM/LEEM Microscope
Part of I06 Aberration Corrected PEEM/LEEM Microscope.
Our technical specification details the requirements of the Aberration Corrected PhotoEmission Electron Microscope (AC-PEEM) and Low Energy Electron Microscope (AC-LEEM) for use on the Nanoscience beamline at DLS. The microscope will be installed on the nanoscience I06 beamline that is dedicated to the study of nanomagnetism and nanostructures using element specific probes such as X-Ray absorption spectroscopy and X-Ray photoelectron spectroscopy. The variable polarisation state of the x-ray light provides a contrast mechanism for imaging different magnetisation states in ferromagnetic and an…
- Published
- 5 Dec 2018
- Status
- active
- CPV
- 38510000 — Microscopes
- Tender period
- — – 8 Jan 2019
Other notices in this procurement
FAQs about this notice
What type of notice is this?
This is a tender notice published via Contracts Finder on 5 Dec 2018.
Which procurement does this notice belong to?
It is part of "I06 Aberration Corrected PEEM/LEEM Microscope", published by Diamond Light Source Ltd.
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