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Automated Semiconductor Test System

Part of Automated Semiconductor Test System.

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The Compound Semiconductor Applications Catapult is procuring an Automated Semiconductor Test System for measurement high power, RF and photonics devices with wafer size up to 200mm. A thermal chuck and chiller system (see notice ICT-2018-024) will be sourced separately and does not form part of this system. The Catapult may also purchase additional related services. Additional information: To express interest in this opportunity and receive the tender documents, please email procurement@csa.catapult.org.uk with ITC-2018-023 in the subject field.

Published
20 Dec 2018
Status
active
CPV
31710000 — Electronic equipment
Tender period
— – 7 Jan 2019
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Other notices in this procurement

This is the only notice on record.

FAQs about this notice

What type of notice is this?

This is a tender notice published via Contracts Finder on 20 Dec 2018.

Which procurement does this notice belong to?

It is part of "Automated Semiconductor Test System", published by COMPOUND SEMICONDUCTOR APPLICATIONS CATAPULT LIMITED.

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