Tender notice · Contracts Finder
200/YE Ion Beam Facility
Part of 200/YE Ion Beam Facility.
The University of Sheffield is out to tender on behalf of the Department of Materials Science and Engineering for a Focused ion beam Facility. We seek to purchase a Dual Beam Focused Ion Beam –Scanning Electron Microscope instrument. The instrument will be used for the investigation of a wide range of materials, including polymers, metals, ceramics, glasses, composites, semiconductors, nanomaterials, nanostructures and coatings. The instrument will be used for: a) The ultra-high resolution investigation of the surfaces of materials using both secondary electron (ISE and ESE) and back s…
- Procurement
- 200/YE Ion Beam Facility
- Published
- 18 Nov 2016
- Status
- active
- CPV
- 38510000 — Microscopes
- Tender period
- — – 8 Jul 2015
Other notices in this procurement
This is the only notice on record.
FAQs about this notice
What type of notice is this?
This is a tender notice published via Contracts Finder on 18 Nov 2016.
Which procurement does this notice belong to?
It is part of "200/YE Ion Beam Facility", published by UNIVERSITY OF SHEFFIELD.
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